Statistics-based Lifetime Simulation Methodology for Power Modules incorporating Degradation Models

The standard approach for the lifetime estimation of power modules (PM) is based on lifetime models derived from accelerated lifetime test (ALT) data. In the mission profile-based simulation, the lifetime model is included, but it does not account for the impact of degradation on the PM model. Therefore, in this paper, a new simulation methodology is proposed for mission profile-based lifetime studies incorporating degradation models, and a statistical analysis is applied that leads to ≈20% better lifetime estimation for the chosen use case.